4EU+ online seminars on "Security, Privacy, and Data Protection"

Biometric systems: security and privacy aspects

17 February 2022
16:00 – 17:30 CET

Link to online seminars: Zoom

Abstract

Applications, services, and devices using biometric systems are continuously growing in innovative applications and solutions such as classical and cyber security, smart phones, and ambient intelligence infrastructures. Biometric systems are designed not just for identity recognition, but they can also be extremely useful to profile users and to understand the human behavior. The talk presents biometric systems focusing on the security and privacy aspects of their application.

Short bio

Fabio Scotti received the Ph.D. degree in computer engineering from the Politecnico di Milano, Milan, Italy, in 2003. He was an Assistant Professor at the Department of Information Technologies, Università degli Studi di Milano, Italy (2002-2015). He was an Associate Professor at the Department of Computer Science, Università degli Studi di Milano, Italy (2015-2020). He is a Full Professor at the Università degli Studi di Milano, Italy since 2020. He is a IEEE Senior Member. Original results have been published in over 150 papers in international journals, proceedings of international conferences, books, book chapters, and patents. His current research interests include biometric systems, machine learning and computational intelligence, signal and image processing, theory and applications of neural networks, three-dimensional reconstruction, industrial applications, intelligent measurement systems, and high-level system design. He is an Associate Editor of the IEEE Transactions on Human-Machine Systems and the IEEE Open Journal of Signal Processing. He has been a Book Editor (Area Editor, section Less-constrained Biometrics) of the Encyclopedia of Cryptography, Security, and Privacy (3rd Edition), Springer. He has been an Associate Editor of the IEEE Transactions on Information Forensics and Security, Soft Computing (Springer) and a Guest Coeditor for the IEEE Transactions on Instrumentation and Measurement.